Nano surface roughness and shape measuring instrument "Nano Seven TN-A1"
Ideal for wafer inspection! Measures surface roughness and shape at the sub-nanometer level.
The "Nano Seven TN-A1" is a nano surface roughness and shape measurement device suitable for wafer inspection. It can be installed near polishing machines for full inspection. Due to its non-contact measurement using lasers, it does not come into contact with the measurement target. Additionally, it employs phase difference measurement using optical heterodyne interference, which is based on the wavelength of light, allowing for a height direction resolution of 0.1 nm and achieving measurement results compatible with AFM. 【Features】 ■ Shortened measurement time ■ Low price setting ■ No need for vibration isolation table ■ Non-contact measurement ■ Capable of wide range measurements ■ Easy operation ■ High resolution *For more details, please refer to the PDF document or feel free to contact us.
- Company：ツクモ工学 本社工場
- Price：5 million yen-10 million yen
